Name: Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Product Details

Product Name:

Spring Test Probe

Barrel:

P.B., Gold-palted

Bottom Plunger:

BeCu/SK4,gold -plated

TOP Plunger:

Pd Alloy/No Plated

Spring:

SWPB(SUS)/Gold Plated

Availability:

Custom Sizes Available

Coating:

Gold Plated

Current Rating:

Contact Resistance:

100 Mohms Max

Bandwidth:

-0.17dB @ 19.6GHz

Inductace:

1.25nH

Captance:

1.61pF

Full Stroke:

1.00mm

Rated Stroke:

0.65mm

Spring Force:

30grams@o.65mm

Mechanical Life Exceeds:

200K

Highlight:

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Payment & Shipping Terms

Minimum Order Quantity

3000pcs

Price

999

Packaging Details

Neutrial Packing or with OEM LOGO

Delivery Time

5-8 WORKING DAYS

Payment Terms

L/C,Western Union,T/T

Supply Ability

100000 rolls per month

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

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Product Description

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Tags：

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

China Supplier ICT test probe P048

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

Factory direct price spring test pin probes

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