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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

Contact Us
Request A Quote
Product Details
Product Name:
Spring Test Probe
Barrel:
P.B., Gold-palted
Bottom Plunger:
BeCu/SK4,gold -plated
TOP Plunger:
Pd Alloy/No Plated
Spring:
SWPB(SUS)/Gold Plated
Availability:
Custom Sizes Available
Coating:
Gold Plated
Current Rating:
1A
Contact Resistance:
100 Mohms Max
Bandwidth:
-0.17dB @ 19.6GHz
Inductace:
1.25nH
Captance:
1.61pF
Full Stroke:
1.00mm
Rated Stroke:
0.65mm
Spring Force:
30grams@o.65mm
Mechanical Life Exceeds:
200K
Highlight:

Gold Plated Spring Test Probe

,

Ultra-Fine Precision BGA Testing Probe

,

Customizable Tip Styles Semiconductor Test Pin

Payment & Shipping Terms
Minimum Order Quantity
3000pcs
Price
999
Packaging Details
Neutrial Packing or with OEM LOGO
Delivery Time
5-8 WORKING DAYS
Payment Terms
L/C,Western Union,T/T
Supply Ability
100000 rolls per month
Product Description
High Efficiency BGA Testing Probes
Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.
Key Product Features
  • Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
  • High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
  • Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
  • Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
  • Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Production Specifications
BGA testing probe technical specifications diagram
Detailed probe dimensions and specifications
Product Images
High efficiency BGA testing probe product photo
Detailed component illustration of test probe assembly
Detailed Component Illustration
Comparison of different test probe tip types and configurations
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process
State-of-the-art manufacturing facility producing electronic probes
Our probe manufacturing facility
Quality control inspection process for test probes
Quality control inspection
Packaged test probes prepared for secure shipment
Packaged probes ready for shipment

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