Name: Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing

Gold Plated Spring Test Probe

2A Current Rating Test Probe

Custom Sizes Semiconductor Test Pin

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

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Product Details

Product Name:

Spring Test Probe

Barrel:

P.B., Gold-palted

Bottom Plunger:

BeCu/SK4,gold -plated

TOP Plunger:

SK4(Be Cu)/Gold Plated

Spring:

SWPB(SUS)/Gold Plated

Availability:

Custom Sizes Available

Coating:

Gold Plated

Current Rating:

Contact Resistance:

100 Mohms Max

Bandwidth:

-0.44dB @ 19.6GHz

Inductace:

1.36nH

Captance:

1.76pF

Full Stroke:

1.8mm

Rated Stroke:

1.8mm

Spring Force:

40grams@1.8mm

Mechanical Life Exceeds:

200K

Highlight:

Gold Plated Spring Test Probe

2A Current Rating Test Probe

Custom Sizes Semiconductor Test Pin

Payment & Shipping Terms

Minimum Order Quantity

3000pcs

Price

999

Packaging Details

Neutrial Packing or with OEM LOGO

Delivery Time

5-8 WORKING DAYS

Payment Terms

L/C,Western Union,T/T

Supply Ability

100000 rolls per month

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Precision Semiconductor Testing

Get Best Price

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing

Get Best Price

High Quality Switch Contact Pin Test Probe YF DE1-038BF32-01C0

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Gold Plated High Durability Spring Test Probe

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Product Description

High Quality Switch Contact Pin Test Probe YF DE1-048DB81-01C0

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Tags：

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing

Gold Plated Spring Test Probe

2A Current Rating Test Probe

Custom Sizes Semiconductor Test Pin

Gold Plated Spring Test Probe

2A Current Rating Test Probe

Custom Sizes Semiconductor Test Pin

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Precision Semiconductor Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing

High Quality Switch Contact Pin Test Probe YF DE1-038BF32-01C0

Gold Plated High Durability Spring Test Probe

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