Name: Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Product Details

Product Name:

Spring Test Probe

Barrel:

P.B., Gold-palted

Bottom Plunger:

BeCu/SK4,gold -plated

TOP Plunger:

SK4(Be Cu)/Gold Plated

Spring:

SWPB(SUS)/Gold Plated

Availability:

Custom Sizes Available

Coating:

Gold Plated

Current Rating:

Contact Resistance:

100 Mohms Max

Bandwidth:

-0.85dB @ 19.6GHz

Inductace:

1.27nH

Captance:

1.62pF

Full Stroke:

1.0mm

Rated Stroke:

0.65mm

Spring Force:

25grams@0.65mm

Mechanical Life Exceeds:

200K

Highlight:

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Payment & Shipping Terms

Minimum Order Quantity

3000pcs

Price

999

Packaging Details

Neutrial Packing or with OEM LOGO

Delivery Time

5-8 WORKING DAYS

Payment Terms

L/C,Western Union,T/T

Supply Ability

100000 rolls per month

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Product Description

High Quality Switch Contact Pin Test Probe YF DE1-051DF57-01C0

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Tags：

Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Double Ended Spring Loaded Pin for Automated Test Equipment (ATE)

Precision Pogo Pin Probe Double Ended for Electronic Testing

High Precision Double Ended Pogo Pin Spring Loaded Test Probe for ICT & FCT

China Supplier Double Ended Pogo Pin Spring Loaded Probe for PCB Testing | Custom Available

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