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Home > Products > Spring Test Probes >
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Double-head test probe for IC testing

Spring contact pin with warranty

YOUFU UF-FTO55FD030-002 test probe

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

Contact Us
Request A Quote
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Product Details
Product Name:
Spring Test Probe
Barrel:
P.B., Gold-palted
Bottom Plunger:
BeCu/SK4,gold -plated
TOP Plunger:
SK4(Be Cu)/Gold Plated
Spring:
SWPB(SUS)/Gold Plated
Availability:
Custom Sizes Available
Coating:
Gold Plated
Current Rating:
3A
Contact Resistance:
50 Mohms Max
Bandwidth:
-0.19dB @ 19.6GHz
Inductace:
1.15nH
Captance:
1.41pF
Full Stroke:
0.7mm
Rated Stroke:
0.5mm
Spring Force:
25grams@0.5mm
Mechanical Life Exceeds:
200K
Highlight:

Double-head test probe for IC testing

,

Spring contact pin with warranty

,

YOUFU UF-FTO55FD030-002 test probe

Payment & Shipping Terms
Minimum Order Quantity
3000pcs
Price
999
Packaging Details
Neutrial Packing or with OEM LOGO
Delivery Time
5-8 WORKING DAYS
Payment Terms
L/C,Western Union,T/T
Supply Ability
100000 rolls per month
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Contact Now
Product Description
Dual-Head High-Frequency IC Test Probe YOUFU UF-FTO55FD030-002
High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.
Key Product Features
  • High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
  • Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
  • Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
  • Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Product Images
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 0





Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 1


Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 2
Detailed Component Illustration
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 3
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 4
Our probe manufacturing facility
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 5
Quality control inspection
Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002 6
Packaged probes ready for shipment
Tags：

gold plated tungsten wire electronics

0.01mm tungsten wire R&D

gold plated molybdenum wire electronics

Send your inquiry directly to us

Tel：86-158-1857-6616
Email：sales@winner-sc.com
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Sichuan WINNER Special Electronic Materials Co., Ltd. focuses on ultra-fine coated metal wire for semiconductor packaging. Winner is a global leader!
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