Name: Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

Home > Products > Spring Test Probes >

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Double-head test probe for IC testing

Spring contact pin with warranty

YOUFU UF-FTO55FD030-002 test probe

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

Request A Quote

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Product Details

Product Name:

Spring Test Probe

Barrel:

P.B., Gold-palted

Bottom Plunger:

BeCu/SK4,gold -plated

TOP Plunger:

SK4(Be Cu)/Gold Plated

Spring:

SWPB(SUS)/Gold Plated

Availability:

Custom Sizes Available

Coating:

Gold Plated

Current Rating:

Contact Resistance:

50 Mohms Max

Bandwidth:

-0.19dB @ 19.6GHz

Inductace:

1.15nH

Captance:

1.41pF

Full Stroke:

0.7mm

Rated Stroke:

0.5mm

Spring Force:

25grams@0.5mm

Mechanical Life Exceeds:

200K

Highlight:

Double-head test probe for IC testing

Spring contact pin with warranty

YOUFU UF-FTO55FD030-002 test probe

Payment & Shipping Terms

Minimum Order Quantity

3000pcs

Price

999

Packaging Details

Neutrial Packing or with OEM LOGO

Delivery Time

5-8 WORKING DAYS

Payment Terms

L/C,Western Union,T/T

Supply Ability

100000 rolls per month

Double Ended Spring Loaded Pin for Automated Test Equipment (ATE)

Get Best Price

Precision Pogo Pin Probe Double Ended for Electronic Testing

Get Best Price

High Precision Double Ended Pogo Pin Spring Loaded Test Probe for ICT & FCT

Get Best Price

China Supplier Double Ended Pogo Pin Spring Loaded Probe for PCB Testing | Custom Available

Get Best Price

Contact Now

Product Description

Dual-Head High-Frequency IC Test Probe YOUFU UF-FTO55FD030-002

High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Tags：

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Double-head test probe for IC testing

Spring contact pin with warranty

YOUFU UF-FTO55FD030-002 test probe

Double-head test probe for IC testing

Spring contact pin with warranty

YOUFU UF-FTO55FD030-002 test probe

Double Ended Spring Loaded Pin for Automated Test Equipment (ATE)

Precision Pogo Pin Probe Double Ended for Electronic Testing

High Precision Double Ended Pogo Pin Spring Loaded Test Probe for ICT & FCT

China Supplier Double Ended Pogo Pin Spring Loaded Probe for PCB Testing | Custom Available

gold plated tungsten wire electronics

0.01mm tungsten wire R&D

gold plated molybdenum wire electronics