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Custom Micro Semiconductor Probes with High Precision and Reliability

Custom Micro Semiconductor Probes with High Precision and Reliability

Place of Origin:

CHINA

Brand Name:

WINNER

Certification:

ISO9100

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Product Details
Payment & Shipping Terms
Minimum Order Quantity
1roll
Price
0.01
Packaging Details
Roll, Neutrial Packing or with OEM LOGO
Payment Terms
L/C, D/A, D/P, T/T
Product Description

Custom Semiconductor Test Probes Manufacturer | Precision Probe Solutions for IC & Wafer Testing
WINNER provides professional custom semiconductor probe solutions for wafer testing, IC testing, electronic inspection, and precision measurement applications. With advanced manufacturing technology, precision machining capability, and surface treatment expertise, WINNER develops high-performance test probes according to customer specifications and application requirements.

Product Description
Semiconductor probes are precision contact components used to establish reliable electrical connections between testing equipment and semiconductor devices. They play an important role in wafer testing, chip testing, and electronic component inspection.

WINNER offers customized probe manufacturing services, including material selection, structural design, precision machining, heat treatment, and surface plating. Our probes are designed to achieve excellent conductivity, stable contact performance, high wear resistance, and long service life.

Customization Capabilities
WINNER provides complete customization solutions:

Probe structure design

Custom dimensions and specifications

Special material selection

Tip shape customization

Surface plating treatment

Electrical performance optimization

Small batch production and mass production

Product Features
High Precision Manufacturing
Advanced processing technology ensures accurate dimensions, consistent quality, and reliable probe performance.

Excellent Electrical Contact
Optimized materials and surface treatments help reduce contact resistance and maintain stable signal transmission.

High Wear Resistance
Special plating processes improve durability and extend service life during repeated testing cycles.

Customized Tip Designs
Different probe tip structures can be developed according to testing requirements, including:

Sharp tip probes

Crown tip probes

Flat tip probes

Custom contact structures

Reliable Performance
Strict quality control ensures stable mechanical strength, excellent conductivity, and consistent performance.

Available Materials
WINNER can provide various probe materials and surface treatments:

Tungsten wire

Rhenium tungsten wire

Gold plated tungsten wire

Molybdenum wire

Gold plated molybdenum wire

Silver alloy wire

Custom alloy materials

Surface Treatment Options
Gold plating (Au)

Nickel plating (Ni)

Other customized coating solutions

Surface treatment improves:

Electrical conductivity

Corrosion resistance

Contact reliability

Wear resistance

Applications & Industries
Semiconductor Testing
Wafer testing

IC testing

Chip inspection

Semiconductor reliability testing

Electronics Manufacturing
PCB testing

Electronic component inspection

Connector testing

Precision electrical measurement

Advanced Technology Fields
MEMS testing

Microelectronics

Sensor testing

Precision instruments

Why Choose WINNER
WINNER specializes in precision metal wire processing and semiconductor-related components, providing customers with integrated solutions from material selection to finished probe products.

Our advantages include:

Professional precision manufacturing experience

Advanced wire processing technology

Customized probe development capability

Strict quality inspection system

Flexible production capacity

Customized Semiconductor Probe Solutions
Whether you require standard semiconductor test probes or fully customized probe designs, WINNER provides professional technical support and manufacturing solutions to meet your specific application needs.

WINNER Custom Semiconductor Probes — Precision Contact Solutions for Next-Generation Semiconductor Testing.

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